| Frequency range | 1.000KHz - 200.000MHz | |
| Temperature Stability | Choose from available options | |
| VDD Sensitivity | ||
| Operating Temperature Range | Choose from available options | |
| Storage Temperature Range | -55°C to +125°C | |
| Supply Voltage (VDD) | ±5% | 3.3VDC |
| Supply Current | 1.000MHz to 9.999MHz 10.000MHz to 19.999MHz 20.000MHz to 39.999MHz 40.000MHz to 50.000MHz 50.001MHz to 54.000MHz 54.001MHz to 60.000MHz 60.001MHz to 133.000MHz 133.001MHz to 166.000MHz 166.001MHz to 200.000MHz | 3mA Maximum 4mA Maximum 5mA Maximum 7mA Maximum 9mA Maximum 14mA Maximum 20mA Maximum 22mA Maximum 25mA Maximum |
| Warm-up Time | ||
| Power Consumption | ||
| Output Voltage HCMOS | ||
| Output Voltage Logic High (VOH) | Logic 1 | 90% VDD Minimum |
| Output Voltage Logic Low (VOL) | Logic 0 | 10% VDD Maximum |
| Duty Cycle | 50% of waveform | 40% / 60% Max or 45% / 55% Max |
| Load Drive Capability | 15pF | |
| Rise/Fall Time | 1.000MHz to 24.000MHz 24.001MHz to 50.000MHz 50.001MHz to 100.000MHz 100.001MHz to 200.000MHz | 5nSec Maximum 4nSec Maximum 3nSec Maximum 2nSec Maximum |
| Control Voltage Range | ||
| Transfer Function | ||
| Input Impedance | ||
| Linearity | ||
| Pullability | ||
| Output Type | ||
| Output Voltage | ||
| Start Up Time | 10mSec Maximum | |
| Standby Current | Disabled Output | 10µA Maximum |
| RMS Phase Jitter | 12KHZ to 20MHz offset freq | <1pSec Maximum |
| Phase Noise | ||
| Tristate Function | VIH = 80% of VDD min to Enable Output VIL = 20% max or grounded to Disable Output (High Impedance) |
|
| Pad 1 Connection | ||
| Mechanical Trim | ||
| Aging | +25°C ±3°C | ±5ppm first year |
| Tune Port Input Impedance | ||
| Tune Port Input Modulation Bandwidth | ||
| Differential Output (VOD) | ||
| Output Offset Voltage (VOS) | ||
| Differential Output Error (dVOS) | ||
| Crystal Cut |
| Fine Leak Test | MIL-STD-883, Method 1014, Condition A |
| Gross Leak Test | MIL-STD-883, Method 1014, Condition C |
| Mechanical Shock | MIL-STD-883, Method 1004 |
| Flammability | UL94-V0 |
| Moisture Resistance | MIL-STD-883, Method 1004 |
| Moisture Sensitivity | J-STD-020, MSL 1 |
| Resistance to Soldering Heat | MIL-STD-202, Method 210, Condition K |
| Resistance to Solvents | MIL-STD-202, Method 215 |
| Solderability | MIL-STD-883, Method 2003 |
| ESD Susceptibility | MIL-STD-883, Method 3015, Class 1, HBM: 1500V |
| Temperature Cycling | MIL-STD-883, Method 1010, Condition B |
| Vibration | MIL-STD-883, Method 2007, Condition A |
| Soldering Temp | |
| Hermeticity of Seal |
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